Texture Coefficient and Conductivity Dependence on the Annealing and Thicknesses of Thin CdS Films

Abstract

Cadmium sulfide thin films prepared by thermal evaporation technique with substrate temperature of 333 K, the film deposited with different thicknesses (100, 150, 200 and 250 nm), then annealed at 373, 423 and 473 K. X-ray diffraction spectra of CdS films were hexagonal polycrystalline structure. The texture coefficient has determined, the highest value of it has observed for the thicker film. The electrical conductivity display two stages of conductivity through the heating temperature range for all thicknesses. Conductivities of the films were found to increase with increasing the annealing temperatures and the thicknesses. Also it can be observed that the conductivity of the film of 250 nm is higher than other films. The thermal activation energies for as deposited CdS and annealed thin films increased with increasing the annealing temperature at the lower temperature range, while they decrease with increasing the thicknesses.
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