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On a Time Series Analysis Generated by a Sensor of an Atomic Force Microscope (AFM)


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DOI: https://doi.org/10.15866/ireme.v12i3.14693

Abstract


In this work, the 0-1 test and scale index are applied to investigate the nonlinear dynamics of the deflection of an AFM cantilever, considering the influence of the Van der Waals force between various surface analyses, variation of the tip geometry, influence of the spring constant, and the variation of amplitude set point of the AFM cantilever. Numerical results showed that the parameters can be very significant for obtaining chaotic or periodic behaviors. The reconstruction of the state-space is carried out with the theory of mutual information and false nearest neighbors observing different phase portraits for different distances between sample-tip. With such results, this work contributes with experimental studies of AFM, demonstrating by means of experiments measurements that the AFM system may present chaotic behavior.
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Keywords


Atomic Force Microscopy; Chaos; Index Scale; 0-1 Test; Reconstruction of State-Space

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References


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