The Organization of Built-in Hardware-Level Mutual Self-Test in Mesh-Connected VLSI Multiprocessors


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Abstract


In the present paper, a new hardware-level approach is proposed, which makes it possible to concurrently detect faulty units across a mesh-connected VLSI multiprocessor based on recurring mutual physical neighbor test actions and making faulty/non-faulty decisions using the majority operator.
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Keywords


Mesh-Connected VLSI Multiprocessors; Reliability; Fault Tolerance; Hardware-Level Test; Mutual Test; Majority Operator

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References


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