Characterization and Diagnosis of IGBT Open-Circuit Fault Based on VSC-HVDC Systems

Xiaoyun Sun

doi:10.15866/iree.v10i3.4772

Characterization and Diagnosis of IGBT Open-Circuit Fault Based on VSC-HVDC Systems

Xiaoyun Sun^(1*)

^(*) Corresponding author

Authors' affiliations

DOI: https://doi.org/10.15866/iree.v10i3.4772

Abstract

This paper studies IGBT open-circuit faults in voltage source converter based high voltage direct current systems (VSC-HVDC). The current response at IGBT open-circuit fault is studied firstly. Then, it is proved that IGBT open-circuit fault in one voltage source converter will result in voltage oscillation at the fundamental frequency on the dc link, which will lead to dc component at the ac side of the non-fault VSC. Thus, a diagnostic method is proposed based on the distortions in the ac currents during the fault. Simulation results are given at the end of the paper.
Copyright © 2015 Praise Worthy Prize - All rights reserved.

Keywords

Voltage Source Converter; VSC-HVDC; Insulated Gate Bipolar Transistor; Open-Circuit Fault; Fault Characteristics; Fault Diagnosis

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