The Organization of Built-in Hardware-Level Mutual Self-Test in Mesh-Connected VLSI Multiprocessors

Jamil Al Azzeh; Michael E. Leonov; Dmitriy E. Skopin; Evgeny A. Titenko; Igor V. Zotov

doi:10.15866/irecos.v17i1.21841

The Organization of Built-in Hardware-Level Mutual Self-Test in Mesh-Connected VLSI Multiprocessors

Jamil Al Azzeh^(1*), Michael E. Leonov⁽²⁾, Dmitriy E. Skopin⁽³⁾, Evgeny A. Titenko⁽⁴⁾, Igor V. Zotov⁽⁵⁾

^(*) Corresponding author

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DOI: https://doi.org/10.15866/irecos.v17i1.21841

Abstract

In the present paper, a new hardware-level approach is proposed, which makes it possible to concurrently detect faulty units across a mesh-connected VLSI multiprocessor based on recurring mutual physical neighbor test actions and making faulty/non-faulty decisions using the majority operator.
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Keywords

Mesh-Connected VLSI Multiprocessors; Reliability; Fault Tolerance; Hardware-Level Test; Mutual Test; Majority Operator

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References

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