Application-oriented Testing of Embedded Processor Cores Implemented in FPGA Circuits


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Abstract


This paper deals with application-oriented testing methods for FPGA circuits. These methods are useful both for manufacturing testing and the detection of the incorrect behaviour of applications in cases when Single-Event Upset (SEU) phenomena occur. After a brief introduction to the test approaches for the detection of SEU-induced faults in FPGAs, the paper focuses on the problem of testing embedded processor cores, and a new approach to the efficient instruction testing of microprocessor cores is presented.
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Keywords


Functional Test; Embedded Processor-Core Test; Single-Event Upset; Built-In Self-Test

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References


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