Application-oriented Testing of Embedded Processor Cores Implemented in FPGA Circuits

M. Wegrzyn(1*), A. Biasizzo(2), F. Novak(3)

(1) Jozef Stefan Institute, Slovenia
(2) Jozef Stefan Institute, Slovenia
(3) Jozef Stefan Institute, Slovenia
(*) Corresponding author

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This paper deals with application-oriented testing methods for FPGA circuits. These methods are useful both for manufacturing testing and the detection of the incorrect behaviour of applications in cases when Single-Event Upset (SEU) phenomena occur. After a brief introduction to the test approaches for the detection of SEU-induced faults in FPGAs, the paper focuses on the problem of testing embedded processor cores, and a new approach to the efficient instruction testing of microprocessor cores is presented.
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Functional Test; Embedded Processor-Core Test; Single-Event Upset; Built-In Self-Test

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