Application of the Mode Matching Technique to Determine the Complex Permittivity of Each Layer for a Bi-Layer Dielectric Material at Microwave Frequency

Hassan Elmajid; Jaouad Terhzaz; Hassan Ammor; Mohamed Chaïbi; Angel Mediavilla Sánchez

doi:10.15866/irecap.v5i3.5947

Application of the Mode Matching Technique to Determine the Complex Permittivity of Each Layer for a Bi-Layer Dielectric Material at Microwave Frequency

Hassan Elmajid^(1*), Jaouad Terhzaz⁽²⁾, Hassan Ammor⁽³⁾, Mohamed Chaïbi⁽⁴⁾, Angel Mediavilla Sánchez⁽⁵⁾

^(*) Corresponding author

Authors' affiliations

DOI: https://doi.org/10.15866/irecap.v5i3.5947

Abstract

A new technique is presented to determine the complex permittivity of each layer for a bi-layer dielectric material. The bi-layer material sample is loaded in a Ku-band rectangular waveguide and its two port S-parameters are measured as a function of frequency using the E8634A Network Analyzer. Also, by applying the mode matching technique, expressions for the S-parameters of the bi-layer dielectric material as a function of complex permittivity of each layer are developed. To estimate the complex permittivity of each layer’s dielectric material, the square sums of errors between the measured and calculated S-parameters are minimised using a nonlinear optimization algorithm. The complex permittivity of each layer for a bi-layer dielectric material such as FR4-Teflon, FR4-Delrin and Delrin-Teflon are determined at the Ku-band frequencies, and the average relative errors between the individual dielectric materials and those of each individual layer of the bi-layer dielectric materials are calculated.
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Keywords

Complex Permittivity; Microwave; Bi-Layer; Dielectric Material; Optimizations Methods

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References

M. D. Deshpande and K. Dudley, Estimation of complex permittivity of composite multilayer material at microwave frequency using waveguide measurements, NASA Langley Res. Center, Hampton, VA, USA, NASA Tech. Memo. (2003, pp.212- 398).

B.J. Wolfson, S.M. Wentworth, Complex permittivity and permeability measurement using a rectangular waveguide, Microwave and Optical Technology, Letters.,Volume.27,2000, pages180-182.
http://dx.doi.org/10.1002/1098-2760%2820001105%2927:3%3C180::aid-mop9%3E3.0.co;2-d

J.Baker-Jarvis, Transmission/reflection and short-circuit line permittivity measurements, National Institute of Standards and Technology, Boulder, Colorado. (1990, 80303–3328).

Hasar, U. C., O. Simsek, An accurate complex permittivity method for thin dielectric materials. Progress in Electromagnetic Research., Volume.91, 2009, pages123-138.
http://dx.doi.org/10.2528/pier09011702

Zaiki Awang and all, A free-space method for complex permittivity measurement of bulk and thin film dielectrics at microwave frequencies., Progress In Electromagnetics Research B.,Volume.51, 2013, pages 307–328.
http://dx.doi.org/10.2528/pierb13031509

J. Terhzaz, H. Ammor, A. Assir, A. Mamouni, Application of the FDTD Method to Determine Complex Permittivity of Dielectric Materials at Microwave Frequencies Using a Rectangular Waveguide., Microwave and Optical technology Letters., Vol.49, 2009,pages1964–1968.
http://dx.doi.org/10.1002/mop.22611

J. Terhzaz, H. Ammor, Á. Mediavilla Sánchez, M. Chaïbi, A. Mamouni, Determination of the Complex Permittivity of Dielectric Materials at Microwave Frequency Using Rectangular Waveguide Measurements and Newton-Raphson Method., EDP Sciences Journals, Matériaux & techniques. Volume.94, 2006, pages 227-233.
http://dx.doi.org/10.1051/mattech:2006039

Blasi, S. Queffelec, Non-Destructive Broad-Band Characterization Method of Thin Ferroelectric Layers at Microwave Frequencies, 38th European Microwave Conference, IEEE Amsterdam, 2008.
http://dx.doi.org/10.1109/eumc.2008.4751572

H. Kassem, V. Vigneras and G. Lunet, Characterization Techniques for Materials Properties Measurement Microwave and Millimeter Wave Technologies from Photonic Band-gap Devices to Antenna and Applications. Intech, 2010.
http://dx.doi.org/10.5772/9055

A. Bogle, M. Havrilla, D. Nyquis, L. Kempel, and E.Rothwell.: Electromagnetic material characterization using a partially-ﬁlled rectangular waveguide., J. Electromagnetic Waves and Appl.Volume.19,(2005) ,pages 1291–1306.
http://dx.doi.org/10.1163/156939305775525909

J. Nelder and R. Mead,A simplex method for function minimization., Computer Journal, Volume.7, 1965, pages 308-313.
http://dx.doi.org/10.1093/comjnl/7.4.308

Optimization Toolbox User’s Guide, the MathWorks, Version 2, 2001.

Nicolson, A. M., Ross, G.F., Measurement of the Intrinsic Properties of Materials by Time Domain Techniques. IEEE Trans. IM, Volume.19 1970), pages 377-382.
http://dx.doi.org/10.1109/tim.1970.4313932

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