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Application of the Mode Matching Technique to Determine the Complex Permittivity of Each Layer for a Bi-Layer Dielectric Material at Microwave Frequency

Hassan Elmajid(1*), Jaouad Terhzaz(2), Hassan Ammor(3), Mohamed Chaïbi(4), Angel Mediavilla Sánchez(5)

(1) Electronic and Communication Laboratory EMI, Mohammed V University-Agdal, Morocco
(2) Electronic and Communication Laboratory EMI, Mohammed V University-Agdal, Morocco
(3) Electronic and Communication Laboratory EMI, Mohammed V University-Agdal, Morocco
(4) Communications Engineering Depart., U. of Cantabria, Spain
(5) Communications Engineering Depart., U. of Cantabria, Spain
(*) Corresponding author


DOI: https://doi.org/10.15866/irecap.v5i3.5947

Abstract


A new technique is presented to determine the complex permittivity of each layer for a bi-layer dielectric material. The bi-layer material sample is loaded in a Ku-band rectangular waveguide and its two port S-parameters are measured as a function of frequency using the E8634A Network Analyzer. Also, by applying the mode matching technique, expressions for the S-parameters of the bi-layer dielectric material as a function of complex permittivity of each layer are developed. To estimate the complex permittivity of each layer’s dielectric material, the square sums of errors between the measured and calculated S-parameters are minimised using a nonlinear optimization algorithm. The complex permittivity of each layer for a bi-layer dielectric material such as FR4-Teflon, FR4-Delrin and Delrin-Teflon are determined at the Ku-band frequencies, and the average relative errors between the individual dielectric materials and those of each individual layer of the bi-layer dielectric materials are calculated.
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Keywords


Complex Permittivity; Microwave; Bi-Layer; Dielectric Material; Optimizations Methods

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References


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