Nano-Magnetic Structures Characterization of Fe Thin Films on Si Substrate


(*) Corresponding author


Authors' affiliations


DOI's assignment:
the author of the article can submit here a request for assignment of a DOI number to this resource!
Cost of the service: euros 10,00 (for a DOI)

Abstract


Structural and magnetic properties of ferromagnetic Fe thin films on semiconductor Si substrates have been reported. We will present topography features of these layers by atomic force microscopy (AFM), characterization of magnetic domains and the nature of the walls between them can be performed using magnetic force microscopy (MFM) and alternating gradient field magnetometer (AGFM) methods. The Fe thicknesses, range from 5 to 150 nm. Our focus is to study systematically the effect of film thickness on magnetic hysteresis anisotropy in ultrathin films grown on semiconductors substrates. MFM images reveal stripe domain structure for the 100nm thick Fe on Si as well as hysteresis curves
Copyright © 2013 Praise Worthy Prize - All rights reserved.

Keywords


Magnetic Nanostructure; Fe Thin Films; Magnetic Properties; Magnetic Anisotropy

Full Text:

PDF


References


R. Naik, C. Kota, J.S. Payson, G.L. Dunifer, Phys. Rev. B 48, 1008 (1993).
http://dx.doi.org/10.1103/physrevb.48.1008

F. D’Orazio, G. Gubbiotti, F. Lucari, E. Tassoni, J. Magn. Magn. Mater. 535, 242 (2002).
http://dx.doi.org/10.1016/s0304-8853(01)01137-4

B. Ghebouli, S.-M. Cherif, A. Layadia, B. Helifa, M. Boudissa, J. Magn. Magn. Mater. 312, 194 (2007).
http://dx.doi.org/10.1016/j.jmmm.2006.09.033

M. Milosavljevic, G. Shao, N. Bibic, C.N. Mc Kinty, C. Jeyncs, K.P. Homewood, J. Appl. Phys. 79, 1438 (2001).

A. Chaiken, R.P. Michel, M.A. Wall, Phys. Rev. B 53, 5518 (1996).
http://dx.doi.org/10.1103/physrevb.53.5518

H.B. Nie, S.Y. Xu, C.K. Ong, Q. Zhan, D.X. Li, J.P. Wang, Thin Solid Films 440, 35(2003).
http://dx.doi.org/10.1016/s0040-6090(03)00833-2

B. Sass, S. Buschhorn, W. Flesch, D. Schmitz, P. Imperia, J. Magn. Magn. Mater. 303, 167 (2006).

I. Chiba, K. Himi, K. Saito, S. Mitani, K. Takanashi, K. Sato, H. Fujimori, J. Magn. Magn. Mater. 226, 1720 (2001).
http://dx.doi.org/10.1016/s0304-8853(00)00871-4

R. A. Hyman, A. Zangwill, and M. D. Stiles, Phys. Rev. B 58, 9276 (1999).
http://dx.doi.org/10.1103/physrevb.58.9276

D. Zhao, F. Liu, D. L. Huber, and M. G. Lagally, Phys. Rev. B 62, 11316 (2000).
http://dx.doi.org/10.1103/physrevb.62.11316

W. Wulfhekel, S. Knappmann, and H. P. Oepen, J. Appl. Phys 79, 988 (1996).
http://dx.doi.org/10.1063/1.360884

R. K. Kawakami, E. J. Escorcia-Aparicio, and Z. Q. Qiu, Phys. Rev. Lett 77, 2570 (1996).
http://dx.doi.org/10.1103/physrevlett.77.2570

M. Dreyer, C. Krafft, R.D. Gomez, IEEE Trans. Magn. 38, 2427 (2002).
http://dx.doi.org/10.1109/tmag.2002.801924

K.-H. Han et al., Carbon 41, 785 (2003);41, 2425 (2003).


Refbacks

  • There are currently no refbacks.


Please send any question about this web site to info@praiseworthyprize.com
Copyright © 2005-2024 Praise Worthy Prize