Effects of Parameter Variations on Low-Power SRAM Decoder
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The effects of environmental and manufacturing process variations on a half-swing pulse-mode low-power SRAM decoder are demonstrated in this paper. The sensitivity of the propagation delay to parameter variations is determined for both a 256×8b low-power SRAM circuit with a self-resetting pulse-mode half-swing decoder and a 256×8b general purpose SRAM circuit. The effects of variations in the power supply voltage, temperature, and gate oxide thickness are considered for both SRAM implementations.
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